TEM测试Pt/BTO/SRO/STO复合薄膜?tem 测试 要求 参考文献: %m4lupu~}s34{3]9a]br)w5.png fig. 1. (a) schematic configuration of the ag/a-lsmo/pt memory cell and the measurement setup. (b) cross sectional tem image of the ag/a-lsmo/pt/ti/sio2 structure [1]. 我们的样品: f@%g2]qk2`owhppfa5ign[i.png 左图为示意图,有图为实物图。 我们希望像文献[1]中图1那样,能够看到pt/bto/sro/sro的横截面tem图像,特别是pt/bto的接触部位。 参考文献: [1]liu d, wang n, wang g, et al. nonvolatile bipolar resistive switching in amorphous sr-doped lamno3 thin films deposited by radio frequency magnetron sputtering[j]. applied physics letters, 2013, 102(13): 134105.查看更多5个回答 . 11人已关注